시험 정보를 필요하거나 문의 사항이 있으면 이메일 info@iigvietnam.edu.vn 또는 전화번호 1900 636 929 (근무시간)으로 연락하십시오.
- Institutions make request by sending a hard copy of the signed and stamped Letter of Enquiry on Result Verification with enclosed list of candidates to IIG Verification Department at 217 Quan Hoa, Nghia Do, Ha Noi; or a soft copy of the signed and stamped Letter of Enquiry on Result Verification with an excel file of candidates information to haukiem@iigvietnam.edu.vn
- The Result Verification response time should not exceed 5 working days.
- IIG Vietnam will respond via an official letter sent via email, and the hard copy will also be sent to the institution through postal mail.
For the TOEIC test, there must be a minimum of five working days between the candidate's previous test and the next test, excluding Saturdays, Sundays, and holidays.
- Each candidate receives a TOEIC Certificate of Achievement only once for each test.
- To apply for a Certificate of Achievement, candidates must ensure their Score Certificate is still valid and complete the registration process at least 14 days before its expiration date.
- To request a Certificate of Achievement, candidates should visit the IIG Vietnam Office and provide the following:
1. Original ID card/Citizen ID card used for exam registration.
2. One photocopy of the Score Certificate.
3. A issuance fee of 250,000 VND.
- If you registered for the test through a different agency (not IIG Vietnam's counter or test sites), you must obtain a confirmation letter from that agency, allowing you to request the service at IIG Vietnam.
- The processing time for issuance is 10 working days at IIG Hanoi office and 15 working days at IIG HCM and Da Nang offices.
On the day of the TOEFL iBT test, please make sure to:
- Arrive at the test venue at least 30 minutes before the designated check-in time.
- Bring your confirmation ticket and a valid ID document, such as an ID card, Citizen ID card, or Passport, to complete the test entry process.
Keep in mind that there must be a minimum of 12 days between each attempt of the test.